Veuillez utiliser cette adresse pour citer ce document :
Titre: Radiation hardness studies in a CCD with high-speed column parallel readout
Auteur(s): A. Sopczak, a∗S. Aoulmit,b K. Bekhouche,b C. Bowdery,a C. Buttar,c C. Damerell,d G. Davies,a D. Djendaoui,b L. Dehimi,b T. Greenshaw,e M. Koziel,a D. Maneuski,c K. Stefanov,d T. Tikkanen,e T. Woolliscrofte and S. Wormd
Mots-clés: Models and simulations; Radiation damage to detector materials (solid state).
Date de publication: 19-mai-2014
Résumé: Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) collaboration is developing Column-Parallel CCDs (CPCCDs) for the vertex detector of the International Linear Collider (ILC). The CPCCDs can be read out many times faster than standard CCDs, significantly increasing their operating speed. The results of detailed simulations of the charge transfer inefficiency (CTI) of a prototype CPCCD including the variation of model parameters are reported. The effects of bulk radiation damage on the CTI of a CPCCD are studied by simulating the effects of two electron trap levels, 0.17 and 0.44 eV, at different concentrations and operating temperatures. The dependence of the CTI on different occupancy levels (percentage of hit pixels) and readout frequencies is also studied. The optimal operating temperature for the CPCCD, where the effects of the charge trapping are at a minimum, is found to be about 230 K for the range of readout speeds proposed for the ILC. The results of the full simulation have been compared with an analytic model.
Collection(s) :Publications Internationales

Fichier(s) constituant ce document :
Fichier Description TailleFormat 
Bekhouche_jinst2008.pdf378,91 kBAdobe PDFVoir/Ouvrir

Tous les documents dans DSpace sont protégés par copyright, avec tous droits réservés.