Browsing by Subject IGZO; TFT; bias stress; optical stress; defects; SILVACO simulation

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 1 of 1
Issue DateTitleAuthor(s)
3-Mar-2016Numerical simulation of bias and photo stress on indium-gallium-zinc-oxide thin film transistorsM. Adaika; Af Meftah; N. Sengouga; M. Henini